National Semiconductor LM26LV Manual de usuario

Revision A

July 16,2007

LM26LV Evaluation Board User’s Guide

Table of Contents

Table of Contents 2

References 3

1.0 Introduction 4

1.1 Block Diagram 4

2.0 Quick Start 5

2.1 Quick Start Diagram 5

3.0 Functional Description 6

3.1 LM26LV Evaluation Board Connection Table 6

4.0 Electrical and Mechanical Specifications 7

4.1 Electrical Specifications 7

4.2 Electrical Schematic 7

4.3 Evaluation Board Layout 8

4.4 Bill of Materials 9

4.5 Mechanical Specifications 9

LM26LV Evaluation Board User’s Guide

References

1. “LM26LV 1.6V, LLP-6, Factory Preset Temperature Switch and Temperature Sensor”

datasheet.

The latest copy of the LM26LV datasheet can be obtained by going to the National

Semiconductor websitewww.national.com, by searching on “LM26LV”, and then

downloading the LM26LV.pdf file.

1.0 Introduction

The LM26LV Evaluation Board offers the

user a convenient way to experiment with

the operation of the LM26LV Temperature

Switch and Temperature Sensor.

There are jumpers that allow the insertion of

an output series resistor, the measurement

of IDD, and the selection of the TRIP TEST

mode.

By default, jumpers J3 (IDD) and J4

(VOUT) are installed. Resistor R3 can be

installed and J4 removed to insert it in

series with the output. See the datasheet for

recommended values for R3. By default J2

is left open but a jumper is provided so that

the user can use the TRIP TEST mode.

Note that R1 is only in the circuit for

protection. This resistor is not required in

actual operation. The TRIP TEST Pin can

be connected directly to VDD to select the

TRIP TEST Mode.

R2, the pull-up resistor for the open-drain

output OVERTEMP#, is 100k on the board.

See the datasheet for more details about this

value. If this pin is not used by the customer

it may be left open.

The block diagram below shows the

jumpers in the default condition.

1.1Block Diagram

LM26LV

Under Test

Optional Resistor

VDD GND

IDD

OVERTEMP

Default =

Jumpered

TRIP

TEST

Default = Not

Jumpered

TRIP TEST

Default =

Jumpered

100k

TRIP TEST

2.0 Quick Start

The diagram below shows how the

LM26LV is connected in a typical bench

test configuration.

Before applying power directly to the

LM26LV Evaluation Board, make sure that

the voltage is between +1.6 VDC and +5.5

VDC. Also make sure that J3 and J4 are

jumpered for normal operation. Jumpering

J2 will put the LM26LV in TRIP TEST

mode, not for normal operation.

Apply power to the LM26LV evaluation

board. Measure the output voltage

connected between to output pin (J4) and

ground for the VTEMP Output voltage.

2.1 Quick Start Diagram

TRIP TEST

IDD

POWER IN

VDD

VOUT

GND

OT#

VOUT

VDD

GND

National Semiconductor

LM26LVEB Evaluation Board

POWER SUPPLY

TRIP

TEST

1.6V to 5.5V Jumper Both J3 and J4

for Normal Operation

Jumper J2 for

TRIP TEST Only

Output Test Pins Only

Do Not Inject Signals Here

3.0 Functional Description

See the details of the normal operation and the

TRIP TEST mode operation in the datasheet.

See the datasheet for details regarding the

VTEMP inversely proportional output

voltage vs temperature characteristic.

3.1 LM26LVEB Evaluation Board Connection Table

Connector

Label Connector

Name Pin

Number Description

1 VDD Supply +1.6 to 5.5 VDC to this pin.

J1 POWER IN

2 GND This is Power Supply return for VDD Input

J2 TRIP TEST 1 -2 If pins 1 and 2 are jumpered then TRIP TEST

Mode is selected.

J3 IDD

Jumper is installed unless a milliammeter is used

to measure the actual IDD.

J4 VOUT Output Jumper is installed across pins 1 and 2 by default.

Otherwise resistor R3 is in series with the output.

J5 Test Pins

Use these pins to test and monitor the signals on

the board. Do not inject signals here.

4.0 Electrical and Mechanical Specifications

4.1 Electrical Specifications

Power Requirements

The Board uses the +1.6 VDC to +5.5 VDC and GND lines from an external

low-noise power supply. +1.6 VDC to

+5.5 VDC

4.2 Electrical Schematic

Figure 4.2 Schematic Diagram of the LM26LV Evaluation Board

4.3 Evaluation Board Layout

Figure 4.3 Layout diagram of the LM26LV Evaluation Board

4.4 Bill of Materials for LM26LV Evaluation Board

Item Quantity Reference Part

1 2 C1, C2 Capacitor, Ceramic, 0.01 uF

2 1 C3 Capacitor Ceramic, 2.2 uF

3 4 J1, J2, J3, J4 Header, 1X2, 0.1 in centers

4 1 J5 Header, 1X6, 0.1 in centers

6 2 R1, R2 Resistor, 100k

7 1 R3 Resistor, (not stuffed)

8 1 U1 LM26LVCISD Device Under Test (DUT)

9 1 -- Circuit Board, Fabricated, LM26LVEB Evaluation Board,

Rev. 1

4.5 Mechanical Specifications

4.5.1 Operating Mechanical and Environmental Specifications

Minimum Typical Maximum

Temperature 0°C 25°C 70°C

4.5.2 Evaluation Board Basic Dimensions

1.650 in/ 4.191 cm

1.050 in/ 2.667 cm

4.5.3 Electrostatic Discharge (ESD) Precautions

The user shall use ESD precautions as specified in National Semiconductor ESD document

(SC)CSI-3-038 available through www.national.com.

BY USING THIS PRODUCT, YOU ARE AGREEING TO BE BOUND BY THE TERMS AND CONDITIONS OF

NATIONAL SEMICONDUCTOR'S END USER LICENSE AGREEMENT. DO NOT USE THIS PRODUCT UNTIL YOU

HAVE READ AND AGREED TO THE TERMS AND CONDITIONS OF THAT AGREEMENT. IF YOU DO NOT AGREE

WITH THEM, CONTACT THE VENDOR WITHIN TEN (10) DAYS OF RECEIPT FOR INSTRUCTIONS ON RETURN OF

THE UNUSED PRODUCT FOR A REFUND OF THE PURCHASE PRICE PAID, IF ANY.

The LM94022 Evaluation Boards are intended for product evaluation purposes only and are not

intended for resale to end consumers, are not authorized for such use and are not designed for

compliance with European EMC Directive 89/336/EEC, or for compliance with any other

electromagnetic compatibility requirements.

National Semiconductor Corporation does not assume any responsibility for use of any circuitry or

software supplied or described. No circuit patent licenses are implied.

LIFE SUPPORT POLICY

NATIONAL'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN

LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF

THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein:

1. Life support devices or systems are devices

or systems which, (a) are intended for

surgical implant into the body, or (b)

support or sustain life, and whose failure to

perform, when properly used in accordance

with instructions for use provided in the

labeling, can be reasonably expected to

result in a significant injury to the user.

2. A critical component is any component in a

life support device or system whose failure to

perform can be reasonably expected to cause

the failure of the life support device or system,

or to affect its safety or effectiveness.

BANNED SUBSTANCE COMPLIANCE

National Semiconductor certifies that the products and packing materials meet the provisions of the Customer Products

Stewardship Specification (CSP-9-111C2) and the Banned Substances and Materials of Interest Specification (CSP-9-

111S2) and contain no ‘‘Banned Substances’’ as defined in CSP-9-111S2.

National Semiconductor

Corporation

Americas Customer Support

Center

Tel: 1-800-272-9959

Email: [email protected]

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Fax: +49 (0) 1 80-530 85 86

Email: [email protected]

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Support Center

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Tel: 81-3-5639-7560

Fax: 81-3-5639-7507

Email:

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National does not assume any responsibility for any circuitry described, no circuit patent licenses are implied and National

reserves the right at any time without notice to change said circuitry and specifications.

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