Tektronix TDS3LIM Manual de usuario

User Manual

TDS3LIM

Limit Test

Application Module

071-0934-00

*P071093400*

071093400

Tektronix products are covered by U.S. and foreign patents,

issued and pending. Information in this publication supercedes

that in all previously published material. Specifications and

price change privileges reserved.

Tektronix, Inc., P.O. Box 500, Beaverton, OR 97077

TEKTRONIX, TEK, TEKPROBE, and Tek Secure are

registered trademarks of Tektronix, Inc.

DPX, WaveAlert, and e*Scope are trademarks of

Tektronix, Inc.

WARRANTY SUMMARY

Tektronix warrants that the products that it manufactures and

sells will be free from defects in materials and workmanship

for a period of one (1) year from the date of shipment from an

authorized Tektronix distributor. If a product proves defective

within the respective period, Tektronix will provide repair or

replacement as described in the complete warranty statement.

To arrange for service or obtain a copy of the complete

warranty statement, please contact your nearest Tektronix sales

and service office.

EXCEPT AS PROVIDED IN THIS SUMMARY OR THE

APPLICABLE WARRANTY STATEMENT, TEKTRONIX

MAKES NO WARRANTY OF ANY KIND, EXPRESS OR

IMPLIED, INCLUDING WITHOUT LIMITATION THE

IMPLIED WARRANTIES OF MERCHANTABILITY AND

FITNESS FOR A PARTICULAR PURPOSE. IN NO EVENT

SHALL TEKTRONIX BE LIABLE FOR INDIRECT,

SPECIAL OR CONSEQUENTIAL DAMAGES.

Contents

Safety Summary 2. . . . . . . . . . . . . . . . . . . . . . . . . . . .

Installing the Application Module 5. . . . . . . . . . . . . . .

Limit Testing Concepts 5. . . . . . . . . . . . . . . . . . . . . . .

TDS3LIM Overview 8. . . . . . . . . . . . . . . . . . . . . . . . . .

Accessing Limit Test Menus 9. . . . . . . . . . . . . . . . . . .

Creating a Limit Test Template 11. . . . . . . . . . . . . . . . .

Selecting a Limit Test Input 14. . . . . . . . . . . . . . . . . . . .

Selecting Limit Test Responses 15. . . . . . . . . . . . . . . . .

Starting Limit Testing 16. . . . . . . . . . . . . . . . . . . . . . . .

TDS3LIM Conventions 17. . . . . . . . . . . . . . . . . . . . . . . .

Menus 19. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Contacting Tektronix

Phone 1-800-833-9200*

Address Tektronix, Inc.

Department or name (if known)

14200 SW Karl Braun Drive

P.O. Box 500 Beaverton, OR 97077 USA

Web site www.tektronix.com

Salessupport 1-800-833-9200,selectoption1*

Servicesupport 1-800-833-9200,selectoption2*

Technical

support Email:[email protected]

1-800-833-9200,selectoption3*

1-503-627-2400

6:00 a.m. – 5:00 p.m. Pacific time

*This phone number is toll free in North America. After

office hours, please leave a voice mail message.

Outside North America, contact a Tektronix sales office

or distributor; see the Tektronix web site for a list of

offices.

Safety Summary

To avoid potential hazards, use this product only as

specified. While using this product, you may need to

access other parts of the system. Read the General Safety

Summary in other system manuals for warnings and

cautions related to operating the system.

Preventing Electrostatic Damage

CAUTION. Electrostatic discharge (ESD) can

damage components in the oscilloscope and its

accessories. To prevent ESD, observe these

precautions when directed to do so.

UseaGroundStrap. Wear a grounded antistatic wrist strap

to discharge the static voltage from your body while

installing or removing sensitive components.

Use a Safe Work Area. Do not use any devices capable of

generating or holding a static charge in the work area

where you install or remove sensitive components.

Avoid handling sensitive components in areas that have a

floor or benchtop surface capable of generating a static

charge.

Handle Components Carefully. Do not slide sensitive

components over any surface. Do not touch exposed

connector pins. Handle sensitive components as little as

possible.

Transport andStoreCarefully. Transport and store sensitive

components in a static-protected bag or container.

Manual Storage

The oscilloscope front cover has a convenient place to

store this manual.

Installing the Application Module

Please refer to the TDS3000 & TDS3000B Series

Application Module Installation Manual for information

on installing the application module.

Limit Testing Concepts

Limit testing is the ability to compare an active signal

with a template waveform. The following figure shows

an active waveform (dark sine wave) being compared to

a template waveform (shaded area).

Any part of the active waveform that exceeds the tem-

plate waveform’s envelope is a limit test waveform

violation, which the oscilloscope highlights. You can set

the oscilloscope to respond to a limit test violation by

stopping limit testing, emitting a beep, and so on. The

following figure shows the highlighted (black) part of

the active waveform that exceeds the limit test envelope.

A template is an envelope waveform that consists of

minimum/maximum (min/max) pairs of sample points.

Template envelope waveforms created from 500 point

source waveforms contain 250 min/max pairs; Template

envelope waveforms created from10K point waveforms

contain 5000 min/max pairs.

The following figure represents how the oscilloscope

creates the template waveform limit test envelope from

user-entered vertical and horizontal division units.

Division units are referenced to graticule divisions,

where 1 major division contains 1000 millidivisions, or

mdivs. The minimum mdiv unit is 20, which equals one

screen pixel.

Vertical

limits Horizontal

limits Resulting

template

When a source waveform is compared with an envelope

waveform, each source waveform sample point value is

compared to the vertical and horizontal min/max values

of the corresponding envelope waveform sample point.

Any source waveform data point that is not equal to or

within the corresponding template envelope min/max

values is a violation.

Accessing Limit Test Menus

You access the TDS3LIM limit test controls from either

the limit test QuickMenu or from the Applications menu.

The QuickMenu displays a single bottom and side menu

that provides quick access to all limit test functions.

To display the limit test QuickMenu, do the following

steps:

1Push the QUICKMENU panel button.

2Push the Menu bottom button to select Limit Test.

The oscilloscope displays the limit test bottom and

side menu items.

TDS3LIM Overview

This section provides an overview of the TDS3LIM

Limit Test application module features, and describes

how to access the limit test functions.

You can do the following limit test tasks with the

TDS3LIM application module:

HCreate and save up to four template waveforms in

reference memory. You can create a template

waveform from either an active input signal or from a

saved reference waveform.

HSelect the channel to compare to the template. You

can compare multiple channels to a single template

waveform, compare each channel to a single template

waveform, or any combination of the above.

HSet the oscilloscope to respond to waveforms that

exceed the template limits. You can set the

oscilloscope to stop acquiring waveforms, save the

failed waveform data to a file, emit a beep, save the

screen image to the hard copy device, or any

combination of the above.

The Applications menus provide multiple bottom and

side menu items that contain all limit test controls and

settings. The menu items contain text or graphics that

more fully describe the function of each menu item.

To display the limit test menu items in the Applications

menu, do the following steps:

1Push the UTILITY panel button.

2Push the System bottom button to select Apps.

3Push the Module button to select Limit Test. The

bottom and side menus change to show the limit test

functions.

Creating a Limit Test Template

You must create a limit test waveform template before

you can do limit testing. The TDS3LIM lets you easily

create a template by using a known good waveform

(active or reference), using the vertical and horizontal

division units to graphically define the template wave-

form envelope, and saving the template to reference

waveform memory (Ref1 - Ref4).

To use an active waveform to create a limit test template,

do the following steps:

1Connect a known good waveform to any one of the

oscilloscope inputs.

2Set the oscilloscope horizontal and vertical controls to

optimize the waveform size and position on the

screen.

NOTE. Use the Average acquisition mode to

create a smoother, cleaner template waveform.

You can also save the oscilloscope settings from

step 2 into setup memory so that later on you

can quickly reload the oscilloscope settings to

correctly display the incoming waveform for

limit testing.

NOTE. Use Envelope acquisition mode in order

to create template waveforms that include

occasional overshoots.

8Push the ±H Limit side button to select the horizontal

limits field. Use the general purpose knob to set the

template waveform envelope horizontal limits. Refer

to page 6 for an explanation of the limit units.

9Push the Store Template bottom button to create the

limit test waveform and save it to the specified

reference memory location. If the template reference

waveform is currently displayed, the oscilloscope

redraws the reference waveform using the newly

stored values.

10 If the template reference waveform is not currently

displayed, push the CONTROL bottom button to

select On. The oscilloscope displays the reference

waveform.

11 If the template reference waveform does not meet

your requirements, repeat steps 7 through 9 to change

the template waveform envelope.

3Push the QUICKMENU panel button.

4Push the Menu bottom button to select Limit Test.

The oscilloscope displays the limit test bottom and

side menu items.

5Push the Template Source/Destination side button to

select the Source field; use the general purpose knob

to select the channel to which the known good signal

is connected (Ch1 - Ch4).

You can also create a limit test waveform template

from a reference waveform by using the general

purpose knob to select a reference waveform

(Ref1-Ref4).

6Push the Source/Destination side button to select the

Destination field; use the general purpose knob to

select the reference memory location where you want

to store the template waveform (Ref1 - Ref4).

7Push the ±V Limit side button to select the template

vertical limits field. Use the general purpose knob to

set the template waveform envelope vertical limits.

Refer to page 6 for an explanation of the limit units.

Selecting a Limit Test Input

To select the channel source for comparing with a

template, do the following steps (the Limit Test Quick-

Menu must still be displayed):

1Connect the test waveform to any one of the

oscilloscope inputs.

2Set the source waveform horizontal and vertical

settings to the same values that were used to create the

template.

3Push the Waveform Comparisons bottom button for

the test waveform channel to select the limit test

template (Ref1 - Ref4).

Selecting Limit Test Responses

When the active waveform exceeds the template wave-

form’s envelope, the oscilloscope can do one or more of

the following actions:

HSend a hard copy of the screen to a printer or file

HSave the failing test waveform to a file on the floppy

disk

HEmit a beep each time the test waveform fails

HStop waveform acquisition and display the failing

waveform(s)

In the QuickMenu, the On Violation side menu uses two

buttons, as shown in the following figure.

Select a response

Enable/disablea response

Use the upper menu button to select a response, and then

use the lower menu button to enable or disable the

selected response. You can select and enable any com-

bination of responses.

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