Contents
Page
1. Preface ································································································· 1
1.1 ●Initial setting at the time of delivery······················································· 1
2. Confirmation prior to use············································································ 2
2.1 ●Unpacking ···················································································· 2
2.2 ●Cautions for handling········································································ 2
3. Name of parts and functions ········································································ 3
3.1 ●Front panel···················································································· 3
3.2 ●Rear panel····················································································· 6
4. Preparation prior to use ·············································································· 8
4.1 ●Zero adjustment of output voltmeter······················································· 8
4.2 ●Connection of protective ground terminal ················································ 8
4.3 ●Connection with external control device·················································· 8
4.4 ●Connection of high voltage cable ·························································· 8
4.5 ●Connection of power supply cable························································· 9
4.6 ●Throw in and shut off of power source···················································· 9
4.7 ●Before the test ················································································ 9
5. Setting items in each mode·········································································10
5.1 ●READY status···············································································10
5.2 ●Setting mode of test condition·····························································10
5.3 ●Memory write-in mode·····································································10
5.4 ●Memory read-out mode ····································································10
6. Kind of test mode and flow of setting·····························································11
6.1 ●Kind of test mode ···········································································11
6.2 ●Flow of setting ··············································································11
7. Setting of test mode ·················································································12
7.1 ●Status of display and expression in instruction manual ································12
7.2 ●Selection of each test mode································································12
8. Setting of test condition for withstanding voltage test ··········································13
8.1 ●Test range of withstanding voltage test···················································13
8.2 ●Referential voltage··········································································14
8.3 ●High limit of leak current ··································································16
8.4 ●Low limit of leak current···································································17
8.5 ●Test time······················································································19
9. Memory function ····················································································21
9.1 ●Configuration of memory··································································21
9.2 ●Memory write-in············································································21
9.3 ●Memory read-out············································································22
