LANGER EMV-Technik P1401 Manual de usuario
2018.03.22 User Manual P1400 P1500 Final.docx
User Manual
P1401/P1501 set
RF field coupling up to 1 GHz
P1402/P1502 set
RF field coupling up to 3 GHz
- Translation of the original user manual -
Copyright © Juni 2014
LANGER EMV-Technik GmbH
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LANGER
EMV-Technik
DE-01728 Bannewitz
mail@langer-emv.de
www.langer-emv.com
P1401/P1501 and P1402/P1502 set
Content: Page
1Safety instructions 3
2Description of the system 5
Use 52.1
P1401 and P1402 field sources 72.2
P1501 and P1502 field sources 92.3
Measurement outputs of the field sources 112.4
D70 h10 and D70 h03 spacer rings 112.5
FKE 30 field chamber insert 112.6
EPM 02 and BPM 02 field meter 122.7
Orientation of the field sources 132.8
3Start-up and measurement 14
Measuring devices 143.1
Test board 143.2
Calibration of the measurement set-up 153.3
Measurement set-up 163.4
Measurement 173.5
4Warranty 18
5Technical Parameters 19
P1401/P1501 195.1
P1402/P1502 215.2
EPM 02 / BPM 02 field meters 235.3
6Scope of delivery of the P1401/P1501 set 24
7Scope of delivery of the P1402/P1502 set 25
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LANGER
EMV-Technik
DE-01728 Bannewitz
mail@langer-emv.de
www.langer-emv.com
P1401/P1501 and P1402/P1502 set
1 Safety instructions
Read and follow the operating instructions carefully and keep them in a safe place for later
consultation. The devices may only be used by personnel who are qualified in the field of
electromagnetic compatibility (EMC) and who are eligible to carry out this work.
When using a product from Langer EMV Technik GmbH, please observe the following safety
instructions to protect yourself from electric shocks or the risk of injuries and to protect the devices
used and the test IC from destruction.
Use a power amplifier that is stable under open-circuit conditions and short-circuit proof.
Observe the operating and safety instructions for all devices used in the set-up.
Never use any damaged or defective devices.
Carry out a visual check before using a measurement set-up with a Langer EMV-
Technik GmbH product. Replace any damaged connecting cables before starting
the product.
Never leave a product from Langer EMV-Technik GmbH unattended whilst this is
in operation.
The Langer EMV-Technik GmbH product may only be used for its intended
purpose. Any other use is forbidden.
People with a pace-maker are not allowed to work with these devices.
The test set-up should always be operated via a filtered power supply.
Attention! Functional interference emissions (near fields and far fields) may occur when the
field sources from the P1401/P1501 set or P1402/P1502 set are operated. The user is
responsible for taking appropriate measures to protect all electronic devices used in the
course of the tests. In particular, the user is responsible for protecting the measuring
devices used for the test set-up and all other electronic devices outside the test bench
against interference emissions so that their intended function is not impaired. This can be
achieved by:
- observing an appropriate safety distance
- use of shielded rooms or enclosures (e.g. shielded tents)
A disturbance field is generated in the field chamber of the field source when operating the
test bench. Make sure that the field chamber is not opened under any circumstances during
the test for safety reasons (hazard due to RF). The field source may only be operated with
the field chamber closed and in accordance with the measurement set-up. The test bench
has to be operated in a shielded room or enclosure.
We cannot assume any liability for damage due to improper use.
The disturbances that are injected into the modules can destroy the test IC (latch-up) if their
intensity is too high. Protect the device under test by:
- connecting a protective resistor in the IC's incoming power supply
- increasing the disturbance gradually and stopping when a functional fault occurs
- interrupting the power supply to the test IC in the event of a latch-up.
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LANGER
EMV-Technik
DE-01728 Bannewitz
mail@langer-emv.de
www.langer-emv.com
P1401/P1501 and P1402/P1502 set
Attention! Make sure that internal functional faults are visible from outside. The test IC may
be destroyed due to an increase in the injection intensity if the faults are not visible from
outside. Take the following precautions if necessary:
monitoring representative signals in the test IC
special test software
•visible reaction of the test IC to inputs (reaction test of the test IC)
We cannot assume any liability for the destruction of test ICs!
- 5 -
LANGER
EMV-Technik
DE-01728 Bannewitz
mail@langer-emv.de
www.langer-emv.com
P1401/P1501 and P1402/P1502 set
2 Description of the system
Use2.1
The P1401/P1501 set or P1402/P1502 set can be used to measure the immunity of integrated
circuits (ICs) to magnetic and electric fields in the frequency range of up to 1 GHz and 3 GHz,
respectively.
The P1401 or P1402 field source is used to generate a magnetic test field and the P1501 or P1502
field source to generate an electric test field. The respective field source is positioned above the
test IC by using a spacer ring and its test field is then applied to the IC to measure its immunity to
disturbances.
Figure 1 shows the basic set-up for immunity measurements with the P1501 field source as an
example. The P1401/P1501 or P1402/P1502 IC test system, the ICE1
1
IC test environment as well
as different measuring and test devices
2
are required for the measurement set-up:
Note: The P1401 or P1402 field source is operated under short-circuit conditions and the P1501
or P1502 field source is operated under open-circuit conditions. Any power amplifier that is used
to supply the field sources must be designed for this purpose, i.e. it must be stable under open-
circuit conditions and short-circuit proof.
Figure 1 Basic set-up for immunity measurements using the ICE1 IC test environment and P1401/P1501
IC test system (here: P1501 field source)
1
not included in the scope of delivery
2
not included in the scope of delivery
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LANGER
EMV-Technik
DE-01728 Bannewitz
mail@langer-emv.de
www.langer-emv.com
P1401/P1501 and P1402/P1502 set
No.
Name
Description
P1401 (P1401/P1501 set)
P1402 (P1402/P1502 set)
RF field source to generate a magnetic test field
P1501 (P1401/P1501 set)
P1502 (P1402/P1502 set)
RF field source to generate an electric test field
FKE 30
Field chamber insert (only for P1402 with D70 h10)
D70 h03
Spacer ring, 3 mm
D70 h10
Spacer ring, 10 mm
EPM 02
Field meter to measure the electric field
BPM 02
Field meter to measure the magnetic field
SMA-SMB 1 m
Measuring cable
Table 1 Brief description of the P1401/P1501 set; P1402/P1502 set
The following components, not included in the scope of delivery, are also needed:
ICE1 set, IC Test Environment
(Langer EMV-Technik GmbH)
-GND 25 ground plane
-GNDA 02 ground adapter
-CB 0708 connection board
-OA 4005 oscilloscope adapter
Measuring and test devices
-Directional coupler
-RF power amplifier
-Signal generator
-PC
-Oscilloscope
-Test IC monitoring equipment
Other
-Test board for test IC
The test board together with the test IC is inserted into the ground plane of the measurement set-
up. The field source (here P1501) is located above the test IC by using a spacer ring. A signal
generator and an RF power amplifier are used to supply the field source. A directional coupler can
be used to monitor the forward power.
An oscilloscope and PC are needed to monitor the equipment under test and/or control the
measurement set-up. The voltage present on the electrode (P1501/P1502) and/or the current
flowing through the electric conductor (P1401/P1402) can be monitored via the field sources’
measurement output.
The principal measurement process corresponds to IEC 62132-2:2010.
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LANGER
EMV-Technik
DE-01728 Bannewitz
mail@langer-emv.de
www.langer-emv.com
P1401/P1501 and P1402/P1502 set
P1401 and P1402 field sources2.2
Figure 2 and Figure 3 show the P1401 and P1402 field source which generate a magnetic
test field. Both field sources have two plug connectors, an RF power input (N type) to power the
field source and a measurement output (SMB type) at the top. The power input is marked and
the measurement output is marked .
Figure 2 P1401 field source with 4 cm long electric
conductor
Figure 3 P1402 field source with 3 cm long electric
conductor
On the inside of the field source, the RF power input is connected to the end of the
electric conductor located at the bottom of the field source. The other end of the electric conductor
is connected to ground of the field source and thus causes a short circuit in the RF current path.
The resulting RF current generates a magnetic field that develops around the electric conductor.
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LANGER
EMV-Technik
DE-01728 Bannewitz
mail@langer-emv.de
www.langer-emv.com
P1401/P1501 and P1402/P1502 set
Figure 4 Principle of the immunity measurement using the P1401 or P1402 field source (magnetic field)
Figure 4 shows the basic measurement principle. The field source, the spacer ring and the ground
surface with the test board form a field chamber. This field chamber limits and shields the
generated magnetic field. The FKE 30 field chamber insert has to be used in connection with the
P1402 field source.
Figure 5 FKE 30 field chamber insert for P1402 field source
A current divider (shunt) is located in the current path of the field source to measure the
field-generating current . This current can be calculated from the voltage at the field source's
measurement output (refer to section 2.4). The measurement output is terminated with 50 Ωinside
the field source.
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LANGER
EMV-Technik
DE-01728 Bannewitz
mail@langer-emv.de
www.langer-emv.com
P1401/P1501 and P1402/P1502 set
P1501 and P1502 field sources2.3
Figure 6 and Figure 7 show the P1501 and P1502 field source which generate an electric
test field. Both field sources have two plug connectors, an RF power input (N type) to power the
field source and a measurement output (SMB type) at the top. The power input is marked and
the measurement output is marked .
Figure 6 P1501 field source
Figure 7 P1502 field source
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LANGER
EMV-Technik
DE-01728 Bannewitz
mail@langer-emv.de
www.langer-emv.com
P1401/P1501 and P1402/P1502 set
Figure 8 Principle of the immunity measurement using the P1501 or P1502 field source (electric field)
On the inside of the field source, the RF power input is connected to the electrode located at the
bottom of the field source. Due to the potential difference between the electrode and the ground
surface, an electric field is generated which exits the electrode in the orthogonal direction.
Figure 8 shows the basic measurement principle. The field source, the spacer ring and the ground
surface with the test board form a field chamber. This field chamber limits and shields the
generated electric field.
An ohmic voltage divider is located at the electrode of the P1501 field source to measure the
field-generating voltage . This voltage can be calculated from the voltage at the field source's
measurement output (refer to section 2.4). A capacitive voltage meter is used in the P1502
field source instead to measure the field-generating voltage . The respective correction factors
are thus different (refer to section 2.4). The measurement outputs of both field sources are
terminated with 50 Ωon the inside.
Este manual sirve para los siguientes modelos
3
Tabla de contenidos
